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iruh33p253b1m total ionizing dose test report september 2005 revision 1 internation a l re ctifier cu rrently does n o t have a dscc app roved radi ati on ha rdne ss assu ra nce program for mil-prf - 38 5 34.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 2 list of devices covered by this report include: iruh33p183b1mp iruh33p183b1mk iruh33p183a1mp iruh33p183a1mk iruh33p253b1mp iruh33p253b1mk iruh33p253a1mp iruh33p253a1mk iruh33pa13b1mp iruh33pa13b1mk iruh33pa13a1mp iruh33pa13a1mk iruh50pa23b1mp iruh50pa23b1mk iruh50pa23a1mp iruh50pa23a1mk iruh50p253b1mp iruh50p253b1mk iruh50p253a1mp iruh50p253a1mk iruh50p333b1mp iruh50p333b1mk iruh50p333a1mp iruh50p333a1mk
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 3 table of contents introduction .??????????????????. 4 summary of results ??????????????... 4 test method .?????????????????? 4 test plan .???????????????????. 4 test facility ??????????????????. 6 test results ...?????????????????. 6 conclusion .??????????????????.14 appendix a ? electrical data appendix b ? radiation test specification
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 4 introduction this test report covers the to tal ionizing dose tests performe d on the iruh33p253b1m ultra low dropout linear regulator in a herme tic package. the total ionizing dose test was performed on ten samples of the device from production lot 318855, which had completed mil-prf-38534 ?k? level assembly, screening and group a testi ng may 20, 2004. on september 2 nd , 2005 international rectifier tested this device for total ionizing dos e hardness at the university of massachusetts, nuclear research facility using their co 60 source. summary of results all of the test samples passed the post radiation te st requirements for total ionizing dose levels up to 750k rad(si). the results show a signific ant degradation in the ?off? biased samples above 750k rad(si) but the devices all passed the post radiation test requirements after a 168hr room temperature anneal. the ?on? biased samples passed the post radiation test requirements for all of the required dose levels. test method the test method used as a guide in the developm ent of the test plan was mil-std-883, method 1019 ionizing radiation, condition a. this met hod establishes the basic requirements for the performance and execution of the tests. test plan the samples were exposed to co 60 irradiation in both an ?on? and ?off? biased state per the requirements of the test plan and the radiation test specification. post radiation testing of the devices occurred at the umass facility after each dose step was complete. the devices were tested on september 2 nd , 2005 for post radiation effects for dos e levels up to 1m rad(si). the devices were then placed on an extended room temperature anneal for 168hrs. on biased serial numbers: 1677, 1678, 1689, 1693, and 1771 off biased serial number s: 1676, 1683, 1749, 1759, and 1762 control samples: 1703 and 1730. 1703 used for this test. the radiation test specification is included in appendix b. the testing occurred in the following manner: 1.0 purpose the purpose of this test is to characterize and qu alify the total ionizing dose effects for international rectifier?s hybrid ultra low dropout r egulator devices. the data resulting from the tests may be incorporated in the ir data sheet for the product. 2.0 test responsibility international rectifier shall be responsible for cond ucting the tests, which shall be performed at the university of massachusetts research reactor facility. in ternational rectifier shall be responsible for the final test report.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 5 3.0 test facility 3.1 nuclear reactor the university of massachusetts research reactor shall be used to provide the source for gamma radiation. umrr will also prov ide information on dose rate, total dose, irradiation test times and dosimetry for this evaluation. 3.2 test equipment the necessary test equipment including interface board, cables, power supplies, measurement system, etc. shall be provided by international rectifier. 3.3 sample size sample size shall be determined based on device type, characterization parameters. as a minimum, the sample size shall meet the requirements of mil- pr f-38534. sample size for this tid evaluation equals 12 devices. five of the samples shall be biased with the worst-case input voltage of 6.8 volts and five samples shall be biased ?in-circuit? with the power supply turned off. two samples shall be maintained as controls of which one shall be tested at each dose step. 4.0 test devices 4.1 the following device is planned for total ionizing dose characterization: a. iruh33p253b1m 4.2 all devices shall be subjected to a minimum 16 8hrs of burn-in and verified for correct electrical performance prior to arrival at umrr. 4.3 all devices shall be tested after each radiation exposure per t090067g within 1 hour and placed back on to radiation exposure within 2 hours. 5.0 test method mil-std-883, method 1019 condition a shall be used to establish the procedure for all testing described herein. 6.0 record keeping the reactor facility shall prov ide dosimetry data for the co 60 source. each exposure run shall be cataloged with the appropriate number in order to maintain correl ation to the appropriate data set. ir will be responsible for collecting and compiling the test data. 7.0 test report the test report shall include the following information: a. device type(s), serial numbers, wafer lot identification (per active component) b. test dates c. facility, source type d. bias conditions e. comments and observations f. pre and post electrical data g. summary descriptive including graphs
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 6 test facility the university of massachusetts, lowell, nuclear research reactor is a 1 mega-watt, uranium 235 enhanced core reactor. the umass lowell r adiation laboratory pr ovides controlled radiation environments and analytic al measurement services to government organizations and industry. the laboratory provides facilities for proton, neutron, and gamma environments. the gamma cave is an irradiation room inside this facility having an equi-dimensional volume of 512 cubic feet. a wide range of dose rates, 1gray (100 rad) per hour to 10,000 gray (1m rad) per hour, is available. several small ports penetra te one shielding wall to provide access for instrumentation cables. test results the key pre and post radiation test results are s hown graphically in figures 1 thru 14. the raw test data for all the parameters test ed is shown in appendix a. as outlined in the test plan, five of the devices exposed to total ionizing dose irradi ation were biased ?on? with the maximum input voltage and five samples were placed in the bias circuit with the power supply off or biased ?off?. all of the ?on? bias samples passed the post radiation test requirements up to 1m rad (si). the ?off? bias samples passed the post radiation test requ irements up to 750k rad (si) and failed for output voltage at 1m rad (si). ho wever, these samples all recovered after the extended room temperature anneal and passed all of the post radiation test requirements. the parameters affected the mo st by the ionizing radiation were output voltage, ripple rejection, and shutdown threshold voltage with the worst-case condition being the ?off? bias. output voltage ? figures 1 thru 10 the ?on? bias sample shows a worst-case shift in output voltage of +3.8% at 500k rad (si) but it recovers by 1.0% at 1m rad (si). the ?off? bi as samples show an output voltage shift as much as +4.8% at 750k rad (si) and drop out of regul ation at 1m rad (si). the shifts are most pronounced with the minimum load of 50ma.
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 7 v o u t 1 , i n = 3 .3 v , i o = 1 .5 a 2.400 2.450 2.500 2.550 2.600 1 1 0 1 00 1000 kr ad(si) volts a v g , on bi as m a x , on bi as m i n , on b i as cnt rl figure 1 ?on? biased samples, vout1 vo u t 1 , i n = 3 . 3 v, i o = 1 . 5 a 2.000 2.100 2.200 2.300 2.400 2.500 2.600 1 1 0 1 0 0 1000 kr ad(si) volts cnt rl avg , o f f b i a s m a x , o ff b i a s m i n , of f bi as figure 2 ?off? biased samples, vout1
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 8 v o u t 2, i n = 3 . 135v , i o = 50m a 2.400 2.450 2.500 2.550 2.600 1 1 0 1 0 0 1000 kr ad(si) volts a v g , on b i as m a x , on b i as m i n , on bi as cnt rl figure 3 ?on? biased samples, vout2 v o u t 2, i n = 3 . 135v , i o = 50m a 2.000 2.100 2.200 2.300 2.400 2.500 2.600 1 1 0 100 1000 krad(si) volts cnt rl a v g , of f bi as m a x , of f bi as m i n , of f bi as figure 4 ?off? biased samples, vout2
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 9 v o u t 3, i n = 3 . 135v , i o = 3 . 0 a 2.400 2.450 2.500 2.550 2.600 1 1 0 100 1000 krad(si) volts a v g , on bi as m a x , on bi as m i n , on bi as cnt rl figure 5 ?on? biased samples, vout3 v o u t 3, i n = 3 . 135v , i o = 3 . 0 a 2.000 2.100 2.200 2.300 2.400 2.500 2.600 1 1 0 100 1000 krad(si) volts cnt rl a v g , of f bi as m a x , of f bi as m i n , of f bi as figure 6 ?off? biased samples, vout3
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 10 v o u t 4, i n = 3 . 465v , i o = 50m a 2.400 2.450 2.500 2.550 2.600 1 1 0 100 1000 krad(si) volts a v g , on bi as m a x , on bi as m i n , on bi as cnt rl figure 7 ?on? biased samples, vout4 v o u t 4, i n = 3 . 465v , i o = 50m a 2. 000 2. 100 2. 200 2. 300 2. 400 2. 500 2. 600 1 1 0 100 1000 k rad ( s i ) volts cnt rl a v g , of f bi as m a x , of f bi as m i n , of f bi as figure 8 ?off? biased samples, vout4
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 11 v o u t 5, i n = 3 . 465v , i o = 3 . 0 a 400 450 500 550 600 1 1 0 100 1000 k rad ( s i ) 2. 2. 2. 2. 2. volts a v g , on bi as m a x , on bi as m i n , on bi as cnt rl figure 9 ?on? biased samples, vout5 v o u t 5, i n = 3 . 465v , i o = 3 . 0 a 2. 000 2. 100 2. 200 2. 300 2. 400 2. 500 2. 600 1 1 0 1 00 1000 kr a d ( s i ) volts cnt rl a v g , of f bi as m a x , of f bi as m i n , o ff b i a s figure 10 ?off? biased samples, vout5 ripple rejection ? figures 11 and 12 the ?on? bias samples show a downward shift in signal attenuation of 35db lower at 1m rad (si) but the parameter is stable up to 100k rad (si). the ?off? bias samples show a downward shift
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 12 in signal attenuation of 40db lower at 1m rad (si) and like the ?on ? bias samples the parameter is stable up to 100k rad (si). ri p p l e re j e ct i o n, f = 1 2 0 h z , i o = 5 0 m a 50. 00 55. 00 60. 00 65. 00 70. 00 75. 00 80. 00 85. 00 90. 00 95. 00 100. 00 1 1 0 1 00 1000 kr a d ( s i ) db a v g , on b i as m a x , on b i as m i n , on bi as cnt rl figure 11 ?on? biased samples, ripple rejection r i p p l e r e je c t i o n , f = 120h z , i o = 50m a 50. 00 55. 00 60. 00 65. 00 70. 00 75. 00 80. 00 85. 00 90. 00 95. 00 100. 00 1 1 0 100 1000 k rad ( s i ) db cnt rl a v g , of f bi as m a x , of f bi as m i n , of f bi as figure 12 ?off? biased samples, ripple rejection
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 13 shutdow n threshold voltage ? figures 13 a nd 14 (not specified over radiation) the ?on? bias samples show an overall shift in threshold voltage of +295m v at 500k rad (si) but the parameter does start to recover at 1m rad (si) . the ?off? bias samples show an ov erall shift in threshold voltage of +339mv at 1m rad (si). data is show n here on this parameter for information purposes only. s hut do w n t hre s h o l d 1. 250 1. 300 1. 350 1. 400 1. 450 1. 500 1. 550 1. 600 1. 650 1. 700 1. 750 1 1 0 100 1000 k rad ( s i ) volts a v g , on bi as m a x , on bi as m i n , on bi as cnt rl figure 13 ?on? biased samples, shutdown threshold s hut do w n t hre s h o l d 1. 250 1. 300 1. 350 1. 400 1. 450 1. 500 1. 550 1. 600 1. 650 1. 700 1. 750 1 1 0 100 1000 k rad ( s i ) volts cnt rl a v g , of f bi as m a x , of f bi as m i n , of f bi as figure 14 ?off? biased sample s, shutdown threshold
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 14 conclusion the iruh33p253b1m has demonstrated hardness to ionizing dose radiation exposure to 1m rad (si) with no affect on its performance when the device is in the ?on? bias condition and the results show it to meet all the post radiation test requirements. the result s of this testing also show that when this device is in the ?off? bi as condition it meets all post radiation test requirements up to 750k rad (si) and can be accepted as a 1m rad (si) device based on the results of the extended room temperature anneal per mil-std-883, method 1019. it should also be noted that all of the ?off? bias samples r egulated properly within several seconds after the anneal bias was applied to them.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 15 appendix a electrical data
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 16 electrical test data (pre-radiation) wednesday, august 24, 2005, 5:42 pm test vout1 vout2 vout3 vout4 vout5 vdrop ilatch ripple rej shdn thresh vout@ shdn ishdn* max limit 2.525 2.625 2.625 2.625 2.625 0.400 ---- 200 1.6 100 ---- min limit 2.475 2.375 2.375 2.375 2.375 ---- 3 65 1.0 -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.494 2.504 2.48 2.501 2.482 0.209 10.13 95.16 1.384 -1.18 149.58 1676 2.488 2.497 2.478 2.495 2.476 0.201 10.17 93.18 1.363 0.18 155.39 1677 2.487 2.497 2.475 2.495 2.477 0.205 10.22 95.12 1.384 -2.41 152.92 1678 2.489 2.497 2.479 2.498 2.478 0.209 10.22 94.81 1.363 -1.32 149.11 1683 2.493 2.500 2.481 2.499 2.481 0.197 10.13 95.57 1.363 -2.01 145.16 1689 2.494 2.502 2.482 2.502 2.480 0.205 9.85 95.88 1.384 -2.07 147.06 1693 2.489 2.497 2.476 2.497 2.476 0.197 10.58 95.12 1.322 -1.68 146.25 1749 2.501 2.507 2.489 2.507 2.488 0.208 10.52 95.47 1.336 -1.09 147.15 1759 2.492 2.499 2.478 2.499 2.479 0.212 10.06 91.63 1.378 -1.14 158.07 1762 2.498 2.506 2.486 2.505 2.485 0.197 10.56 94.79 1.378 -4.94 153.07 1771 2.488 2.494 2.477 2.495 2.478 0.205 10.13 95.88 1.363 -1.60 144.69 * data collected for information purposes only parameter not specified for pre-radiation. electrical test data (post radiation ? 100k rad (si)) friday, september 02, 2005, 10:06 am test vout1 vout2 vout3 vout4 vout5 vdrop* ilatch ripple rej shdn thresh vout@ shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 40 ---- -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.501 2.508 2.491 2.508 2.490 0.220 10.07 95.51 1.382 -2.19 149.78 1676 2.521 2.528 2.509 2.526 2.511 0.244 9.93 92.88 1.452 -1.45 148.20 1677 2.523 2.531 2.512 2.532 2.512 0.233 10.11 96.26 1.452 -0.19 141.49 1678 2.519 2.526 2.508 2.527 2.509 0.233 9.89 96.26 1.431 -2.27 144.62 1683 2.526 2.533 2.513 2.533 2.513 0.236 10.07 96.26 1.452 -0.94 137.91 1689 2.531 2.537 2.519 2.537 2.520 0.244 10.02 98.18 1.452 -1.15 137.80 1693 2.525 2.534 2.511 2.534 2.512 0.225 10.43 97.13 1.431 -1.18 134.70 1749 2.528 2.535 2.518 2.534 2.517 0.225 10.48 93.46 1.431 -1.61 140.53 1759 2.518 2.525 2.507 2.524 2.507 0.233 9.98 90.24 1.473 -1.14 151.57 1762 2.525 2.536 2.513 2.534 2.515 0.221 10.52 95.10 1.452 -1.14 143.10 1771 2.526 2.538 2.517 2.534 2.517 0.233 10.07 98.62 1.452 -0.89 134.49 * data collected for information purposes only parameter not specified for post radiation.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 17 electrical test data (post radiation ? 300k rad (si)) friday, september 02, 2005, 11:26 am test vout1 vout2 vout3 vout4 vout5 vdrop * ilatch ripple rej shdn * thresh vout@ shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 65 ---- -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.500 2.506 2.486 2.501 2.486 0.225 10.16 95.52 1.358 -2.43 151.68 1676 2.566 2.571 2.551 2.568 2.548 0.225 9.84 90.72 1.630 -0.51 -5.54 1677 2.567 2.573 2.556 2.574 2.554 0.225 9.39 90.29 1.630 -1.04 133.39 1678 2.558 2.567 2.546 2.567 2.548 0.228 9.57 90.72 1.567 -0.74 130.28 1683 2.584 2.588 2.567 2.586 2.565 0.228 10.21 63.25 1.630 -0.82 128.88 1689 2.576 2.582 2.565 2.584 2.565 0.228 10.12 64.87 1.630 -0.85 127.56 1693 2.570 2.579 2.557 2.577 2.557 0.217 10.57 64.92 1.630 -0.45 127.47 1749 2.582 2.586 2.564 2.584 2.563 0.217 10.39 64.87 1.588 -0.15 132.74 1759 2.554 2.564 2.536 2.557 2.535 0.225 9.89 93.17 1.609 -1.09 144.03 1762 2.584 2.586 2.565 2.585 2.564 0.217 10.52 87.64 1.651 -0.43 132.23 1771 2.576 2.584 2.564 2.582 2.564 0.228 10.07 64.87 1.630 -1.05 124.57 * data collected for information purposes only parameter not specified for pre-radiation. electrical test data (post radiation ? 500k rad (si)) friday, september 02, 2005, 12:03 pm test vout1 vout2 vout3 vout4 vout5 vdrop* ilatch ripple rej shdn thresh vout@ shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 40 ---- -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.500 2.505 2.484 2.503 2.485 0.218 10.167 95.49 1.363 -2.79 150.08 1676 2.587 2.593 2.571 2.590 2.569 0.237 9.804 61.92 1.698 -1.11 136.29 1677 2.577 2.585 2.565 2.585 2.565 0.237 9.850 61.92 1.698 -1.40 130.48 1678 2.569 2.577 2.559 2.577 2.559 0.241 9.804 63.34 1.635 -0.61 128.25 1683 2.613 2.617 2.594 2.614 2.593 0.237 9.486 59.77 1.698 -2.19 126.21 1689 2.587 2.594 2.573 2.595 2.574 0.237 9.895 61.92 1.698 -0.62 1.60 1693 2.580 2.588 2.566 2.588 2.567 0.229 10.213 61.92 1.698 -0.95 123.56 1749 2.605 2.611 2.591 2.609 2.589 0.229 10.213 59.77 1.677 -0.77 128.57 1759 2.563 2.572 2.552 2.570 2.550 0.244 9.577 64.88 1.656 -0.62 139.68 1762 2.606 2.612 2.590 2.610 2.587 0.222 9.850 59.73 1.698 -1.53 128.40 1771 2.583 2.590 2.574 2.588 2.572 0.241 9.532 61.92 1.698 -1.54 123.06 * data collected for information purposes only parameter not specified for post radiation.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 18 electrical test data (post radiation ? 750k rad (si)) friday, september 02, 2005, 12:41 pm test vout1 vout2 vout3 vout4 vout5 vdrop * ilatch ripple rej shdn * thresh vout@ shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 65 ---- -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.495 2.505 2.488 2.503 2.486 0.208 10.208 95.91 1.363 -2.98 153.02 1676 2.595 2.603 2.578 2.600 2.576 0.245 9.345 57.23 1.698 1.12 135.69 1677 2.569 2.575 2.564 2.575 2.553 0.245 9.436 61.95 1.698 -2.09 129.15 1678 2.568 2.575 2.555 2.573 2.554 0.245 9.209 60.75 1.657 -0.21 127.09 1683 2.609 2.619 2.596 2.619 2.597 0.245 9.890 56.58 1.678 -0.30 124.12 1689 2.578 2.587 2.567 2.587 2.565 0.245 9.209 59.73 1.698 -0.38 120.60 1693 2.569 2.579 2.555 2.578 2.555 0.230 10.072 59.73 1.657 -0.37 120.26 1749 2.606 2.617 2.597 2.615 2.595 0.241 9.572 57.94 1.657 0.12 125.55 1759 2.581 2.590 2.566 2.586 2.564 0.245 9.254 59.73 1.698 -0.15 138.32 1762 2.603 2.612 2.591 2.613 2.591 0.223 10.072 56.53 1.698 1.89 130.15 1771 2.572 2.580 2.561 2.578 2.559 0.245 9.527 59.77 1.698 -1.03 119.68 * data collected for information purposes only parameter not specified for pre-radiation. electrical test data (post radiation ? 1000k rad (si)) friday, september 02, 2005, 1:22 pm test vout1 vout2 vout3 vout4 vout5 vdrop* ilatch ripple rej shdn thresh vout@ shdn ishdn* max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 ---- min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 40 ---- -100 ---- serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) (ua) 1703 2.500 2.504 2.501 2.503 2.486 0.207 9.782 95.89 1.386 -2.57 152.52 1676 2.016 2.018 2.013 2.018 2.013 2.352 9.146 54.27 1.700 -0.46 179.94 1677 2.548 2.559 2.537 2.557 2.537 0.245 9.509 58.83 1.679 -0.48 126.55 1678 2.551 2.559 2.542 2.559 2.538 0.241 8.919 60.77 1.637 -0.21 125.14 1683 2.016 2.018 2.013 2.018 2.013 2.340 9.419 51.99 1.679 -2.25 165.87 1689 2.559 2.569 2.548 2.569 2.548 0.249 9.101 59.75 1.658 -1.45 123.35 1693 2.550 2.561 2.535 2.560 2.536 0.234 9.464 59.75 1.637 -0.86 120.46 1749 2.015 2.019 2.014 2.019 2.015 2.343 10.024 53.31 1.702 -0.81 168.40 1759 2.015 2.019 2.014 2.019 2.584 1 0.257 9.206 56.52 1.702 -0.70 140.49 1 device 1759 shows proper regulation for output voltage test five, which is a sign the device has annealed during the test.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 19 1762 2.015 2.019 2.014 2.019 2.015 0.238 9.524 53.66 1.723 -2.58 172.41 1771 2.551 2.560 2.537 2.562 2.537 0.241 8.919 58.83 1.637 -0.61 120.68 * data collected for information purposes only parameter not specified for post radiation. electrical test data (post 168hr room temperature anneal)** friday, september 09, 2005 test vout1 vout2 vout3 vout4 vout5 vdrop* ilatch ripple rej shdn thresh vout@ shdn max limit 2.625 2.625 2.625 2.625 2.625 ---- ---- 200 ---- 100 min limit 2.375 2.375 2.375 2.375 2.375 ---- 3 40 ---- -100 serial # (v) (v) (v) (v) (v) (v) (a) (db) (v) (mv) 1703 2.499 2.506 2.442 2.506 2.495 0.209 8.14 79.0 1.392 6.8 1676 2.520 2.525 2.518 2.525 2.517 0.299 6.82 79.6 1.532 5.3 1677 2.517 2.523 2.514 2.523 2.513 0.283 6.94 80.4 1.548 2.9 1678 2.518 2.523 2.514 2.523 2.513 0.282 7.18 82.1 1.516 3.2 1683 2.533 2.538 2.530 2.539 2.530 0.287 6.94 80.1 1.516 4.1 1689 2.523 2.529 2.519 2.529 2.519 0.287 6.94 81.3 1.528 1.7 1693 2.515 2.523 2.509 2.523 2.509 0.267 7.66 82.8 1.520 3.2 1749 2.536 2.542 2.533 2.542 2.532 0.284 7.18 79.3 1.510 0.2 1759 2.516 2.522 2.513 2.522 2.512 0.294 6.82 79.8 1.540 2.4 1762 2.529 2.536 2.526 2.536 2.525 0.291 7.30 83.2 1.526 1.2 1771 2.514 2.520 2.512 2.520 2.511 0.215 7.06 83.2 1.538 0.7 * data collected for information purposes only parameter not specified for post radiation. ** tested on the eagle ets-564 production test system.
tid test report iruh33p253b1m september 2005, rev 1 205 crawford st, leominster, ma 01453 tel: 976-534-5776 www.irf.com 20 appendix b radiation test specification
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 21 a a produ c t di sc ri pt i o n: 2 . 5 v l o w dropout vol t a g e r e gul a t o r a u tom a ti c t e s t t e ste r : p x i t e s t c o n s ole 04-134 -t c p r og. r e f . test s y m bol test c ondi ti ons r ad lev el : n o tes m in m a x u ni t s a o ut put v o l t age v out v i n = 3. 30 v d c p re r a d 2 . 475 2.5 2 5 v dc io ut = 1.5 a a o ut put v o l t age v out v i n = 3. 135 v d c p re r a d 2 . 375 2.6 2 5 v dc io ut = 50 m a a o ut put v o l t age v out v i n = 3. 135 v d c p re r a d 2 . 375 2.6 2 5 v dc io ut = 3.0 a a o ut put v o l t age v out v i n = 3. 465 v d c p re r a d 2 . 375 2.6 2 5 v dc io ut = 50 m a a o ut put v o l t age v out v i n = 3. 465 v d c p re r a d 2 . 375 2.6 2 5 v dc io ut = 3.0 a a d ro pout v o l t ag e v drop io ut = 3.0 a p re r a d 0 0. 40 v d c a c u r rent li m i t i l i m i t v i n = 3. 3 v d c p re r a d 3 .0 --- a a r i ppl e r e j e c t i o n r rej f = 1 20 h z p r e r a d 6 5 2 00 d b io ut = 50 m a a s hut dow n v s hut dow n p re r a d 1 .0 1. 6 v thr e s h ol d o ut put v o l t ag e v out s hdn v i n = 3. 3 v d c p re r a d - 0. 1 + 0 . 1 v a t s hut do w n io ut = 50 m a vs hd n = +5 vdc s hut dow n i s hut dow n v i n = 3. 3 v d c p re r a d 1 --- --- u a p i n c u rrent io ut = 50 m a vs hd n = +5 vdc n o te s: 1. thes e tes t s a r e perf o rm ed f o r i n form a t i on purpos es onl y. thi s i s propri e t a ry i n f o rm at i o n o f in ternat i o nal r e ct i f i e r h i -r el p r odu ct s and i t i s un ders t o od th at t h i s w i l l not b e d i vu l ged t o a th i r d pa rt y or us ed i n any w a y prej u d i c i a l t o th e i n t e re st of i n t e rn ati ona l r e ct i f i e r h i -r el p r odu ct s. t a ble 1: p r e r a di ati o n t ests, 2 5 c tes t s on l y v i n = 5. 0 v d c, v s h u td ow n ram p f r om 0. 8v t o 4. 8v , o u t p ut m oni to red f o r 100 m v d r o p
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 22 a n 1. thi r th or us of u tom a ti c t e s t t e ste r : p x i t e s t c o n s ole 04-134 -t c p r og. r e f . test s y m bol test c ondi ti ons r ad lev el : n o tes m in m a x u ni t s b o ut put v o l t age v out v i n = 3. 30 v d c p ost r a d 2 . 375 2.6 2 5 v dc io ut = 1.5 a b o ut put v o l t age v out v i n = 3. 135 v d c p ost r a d 2 . 375 2.6 2 5 v dc io ut = 50 m a b o ut put v o l t age v out v i n = 3. 135 v d c p ost r a d 2 . 375 2.6 2 5 v dc io ut = 3.0 a b o ut put v o l t age v out v i n = 3. 465 v d c p ost r a d 2 . 375 2.6 2 5 v dc io ut = 50 m a b o ut put v o l t age v out v i n = 3. 465 v d c p ost r a d 2 . 375 2.6 2 5 v dc io ut = 3.0 a b d ro pout v o l t ag e v drop io ut = 3.0 a p ost r a d 1 --- --- v dc b c u r rent li m i t i l i m i t v i n = 3. 3 v d c p ost r a d 3 .0 --- a b r i ppl e r e j e c t i o n r rej f = 1 20 h z p o st r a d 4 0 2 00 d b io ut = 50 m a b s hut dow n v s hut dow n p ost r a d 1 --- --- v thr e s h ol d b o ut put v o l t ag e v out s hdn v i n = 3. 3 v d c p ost r a d - 0. 1 + 0 . 1 v a t s hut do w n io ut = 50 m a vs hd n = +5 vdc b s hut dow n i s hut dow n v i n = 3. 3 v d c p ost r a d 1 --- --- u a p i n c u rrent io ut = 50 m a vs hd n = +5 vdc o te s: thes e tes t s a r e perf o rm ed f o r i n form a t i on purpos es onl y. s i s propri e t a ry i n f o rm at i o n o f in ternat i o nal e ct i f i e r h i -r el p r odu ct s and i t i s un ders t o od at t h i s w i l l not b e d i vu l ged t o a th i r d pa rt y ed i n any w a y prej u d i c i a l t o th e i n t e re st i n t e rn ati ona l r e ct i f i e r h i -r el p r odu ct s. t a bl e 2: p o st r a di ation t e s t s, 25c te sts on ly v i n = 5. 0 v d c, v s h u td ow n ram p f r om 0. 8v t o 4. 8v , o u t p ut m oni to red f o r 100 m v d r o p
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 23 ra d i a t io n cir c u i t v i n = 6 . 8 v , v o ut = 2. 5v , io=1 0m a u n b i a se d, i n ci r c u i t w i th p o w e r su pp l y o f f 10 0k , 20 0k , 20 0k , 25 0k , 25 0 k 5 0 t o 30 0 r a d(s i )/ se c tf -0 2-0 1 1 ta -02 - 0 0 1 b i as c o n d ition s d o se st e p pr o f i l e p r o g ra m c a rd n u m b er do se ra te ran g e ch am b e r b o ar d nu m b e r g a mma c a v e t a b l e 3: t o t a l do se rad i a t io n req u ir emen t s hig h do se rat e 2 1 0 0 k , 2 0 0 k , 2 00k , 25 0k , 25 0k 5 0 t o 30 0 r a d(s i )/ se c tf -0 2-01 1 ta -02 - 0 0 1 te s t te m p e r a t u r e 2. p e rf orm e d at du r i ng initial q u a l ifica t ion o f t h e de vice a n d re te st e d on l y w h e n sp ec i f i e d by q u a l i t y a s sura nc e du e t o a c h a n g e p e r m i l - p r f - 3 85 34 . gam m a c a v e 25 c +/- 5 c 2 5 c +/- 5 c vin 1 2 3 4 5 r1 250 ohm c1 10uf 50v 2 1 c2 10uf 50v 1 2 c3 10uf 50v 1 2
tid test report iruh33p253b1m septem ber 2005, rev 1 205 crawford st, leom i n ster, ma 01453 tel: 976-534-5776 www.irf.co m 24 a n n e al t e st c i r c u i t 5 - n / c pi n o u t 3 - o u tp ut 4 - s h u t dow n 2 - g n d ext e n d e d roo m t e m p erat ur e a n nea l 3 t a ble 4 : a n n e al t est re q u ir e m e n ts c ham ber t e m p era t ure p r og ram c a rd n u m b e r b p 053 9 1 - in pu t 3. t h e ex te nde d ro om te m p e r atu r e a n ne al i s p e rfo r m e d on dev i c es tha t fa i l t o m e et t he 1 0 00 k dos e ra ti ng. if th e de vi ce s p a ss th e po st-i rra di ati o n te sti n g aft e r th i s ex te nde d ro om t e m p e r atu r e a nne al th en they sh al l be con s i d e r ed qua l i f i e d p r odu c t.. t h i s tes t do es not app l y to pro d uc ts te ste d a t lo w do se rate. b b 037 24c + 6 c , -6 c d u ra ti on 168 hrs + / - 12 hrs b i a s co nd i t i o ns vi n = 6 . 8v, vo ut = 2. 5 v , i o = 1 0 m a b u rn -i n b oar d vin 1 2 3 4 5 r1 250 ohm p r e r a d i ati o n tes t s p o st ra di ati o n te sts p x i 04 -13 4 -tc p x i 04 -13 4 -tc test f i x t ure t e st s y s t em 04-1 35- tf, 04-1 35-0 10- ta 04-1 35- tf, 04-1 35-0 10- ta ta b l e 7 : te s t h a r d w a r e

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